Difference between revisions of "CaseList"

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(Process Issues and Defects)
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==Process Issues and Defects==
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==Process Recipes and Equipment==
  
 
{| border="3"
 
{| border="3"
|+ '''Hybrid Silicon Process'''
 
 
|- style="background:red; color:white"
 
|- style="background:red; color:white"
! Process Step!! Issue or Defect !! Link                 
+
! Equipment!! Recipes!!                  
 
|-  
 
|-  
| [[Initial wafer check]] ||   ||   ||  
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| [[ICP 1]] ||  
|-
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| [[Dice and cleave]] ||   ||   ||  
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|-
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| [[SOI waveguide]] ||   ||   ||  
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|-
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| [[SOI grating]] ||   ||   ||  
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|-
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| [[SOI actives]] ||   ||   ||  
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|-
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| [[Vertical channel]] ||  ||   ||  
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|-
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| [[Protection layer]] ||   ||   ||  
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|-
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| [[Quantum well intermixing]] ||   ||   ||  
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|-
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| [[Wafer bonding]] || Bubbles,Poor Bond, Edge Issues ||   ||  
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|-
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| [[Gap fill]] ||   ||   ||  
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|-
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| [[P-mesa]] ||   ||   ||  
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|-
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| [[Lower SCH]] ||  ||   ||  
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|-
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| [[N-InP]] ||   ||   ||  
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|-
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| [[N-metal]] ||   ||   ||  
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|-
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| [[P-metal]] ||   ||   ||  
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|-
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| [[Ion implantation]] ||   ||   ||  
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|-
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| [[Via]] ||   ||   ||  
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|-
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| [[Probe metal]] ||   ||   ||  
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|-
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| [[Remove III/V in gap]] ||  ||   ||  
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|-
 
|-
| [[Dice and polish]] ||   ||   ||  
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| [[ICP 2]] ||  
 
|-
 
|-

Revision as of 13:55, 30 April 2012

Process Recipes and Equipment

Equipment Recipes
ICP 1  
ICP 2