Difference between revisions of "Measurements"
From OptoelectronicsWiki
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| − | = Optical | + | = Materials Characterization = |
| + | == Atomic Force Microscopy (AFM) == | ||
| + | CNSI has a room devoted to AFM including 2 models Asylum and NanoScope. Contact Mark Cornish <cornish@engineering.ucsb.edu> to get tips and register. The cleanroom also has a NanoScope AFM. | ||
| + | |||
| + | === Asylum AFM === | ||
| + | |||
| + | === NanoScope AFM === | ||
| + | |||
| + | == Optical Characterization = | ||
== LI curves == | == LI curves == | ||
"Example:" This technique allows you to measure output power vs. injection current. The follwoing equipment is used: | "Example:" This technique allows you to measure output power vs. injection current. The follwoing equipment is used: | ||
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= Electrical characterization = | = Electrical characterization = | ||
| + | |||
| + | |||
| + | Analysis: http://gwyddion.net/download.php#stable-osx | ||
= Microwave measurements = | = Microwave measurements = | ||
[[Linearity measurements]] (OIP2, OIP3, SFDR,...) | [[Linearity measurements]] (OIP2, OIP3, SFDR,...) | ||
Revision as of 12:57, 29 July 2010
Contents
Materials Characterization
Atomic Force Microscopy (AFM)
CNSI has a room devoted to AFM including 2 models Asylum and NanoScope. Contact Mark Cornish <cornish@engineering.ucsb.edu> to get tips and register. The cleanroom also has a NanoScope AFM.
Asylum AFM
NanoScope AFM
= Optical Characterization
LI curves
"Example:" This technique allows you to measure output power vs. injection current. The follwoing equipment is used:
- Keithley (link to equipment)
- Agilent powermeter (link)
The measurement can be controlled using this (link) software. A sample plot looks like this: (insert picture). More about this technique can be found in:
- Mr.X et al., IEEE Journ. of Lightwave Technol., vol. x, pp. xxx-xxx, Aug. 2005
- Our own uploaded description (in doc format maybe)
Electrical characterization
Analysis: http://gwyddion.net/download.php#stable-osx
Microwave measurements
Linearity measurements (OIP2, OIP3, SFDR,...)
