Difference between revisions of "Measurements"
(→Asylum AFM) |
(→Atomic Force Microscopy (AFM)) |
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=== NanoScope AFM === | === NanoScope AFM === | ||
| + | |||
| + | === Analysis === | ||
| + | Igor Pro demo: http://www.wavemetrics.com/support/demos.htm | ||
| + | Asylum download requires a login, and to get one takes a little while. | ||
| + | Is it possible to upload that to the wiki? | ||
| + | Gwyddion and GTK+: http://gwyddion.net/download.php#stable-osx | ||
| + | it recommends a specific GTK+, not sure why it matters though. If you | ||
| + | have it from Pidgin or something I'm sure it'll work. | ||
= Optical Characterization = | = Optical Characterization = | ||
Revision as of 13:30, 31 July 2010
Contents
Materials Characterization
Atomic Force Microscopy (AFM)
CNSI has a room devoted to AFM including 2 models Asylum and NanoScope. Contact Mark Cornish <cornish@engineering.ucsb.edu> to get tips and register. The cleanroom also has a NanoScope AFM.
Asylum AFM
Asylum_AFM_MFC-3D_Procedure_v1_-_Basic_Tapping_Mode.docx
NanoScope AFM
Analysis
Igor Pro demo: http://www.wavemetrics.com/support/demos.htm Asylum download requires a login, and to get one takes a little while. Is it possible to upload that to the wiki? Gwyddion and GTK+: http://gwyddion.net/download.php#stable-osx it recommends a specific GTK+, not sure why it matters though. If you have it from Pidgin or something I'm sure it'll work.
Optical Characterization
LI curves
"Example:" This technique allows you to measure output power vs. injection current. The follwoing equipment is used:
- Keithley (link to equipment)
- Agilent powermeter (link)
The measurement can be controlled using this (link) software. A sample plot looks like this: (insert picture). More about this technique can be found in:
- Mr.X et al., IEEE Journ. of Lightwave Technol., vol. x, pp. xxx-xxx, Aug. 2005
- Our own uploaded description (in doc format maybe)
Electrical characterization
Analysis: http://gwyddion.net/download.php#stable-osx
Microwave measurements
Linearity measurements (OIP2, OIP3, SFDR,...)
