Difference between revisions of "E-Beam Lithography (EBL)"

From OptoelectronicsWiki
Jump to: navigation, search
(Proximity Correction)
(Proximity Correction)
Line 4: Line 4:
 
* [[media:Proximity Effect Correction for Electron Beam Lithography2.ppt|Proximity Effect Correction Experiment]]  
 
* [[media:Proximity Effect Correction for Electron Beam Lithography2.ppt|Proximity Effect Correction Experiment]]  
  
Process overview:  [[file:SWEEPER4-1_v4.ppt]]
+
Process overview:  [[file:SWEEPER4-1_v4.ppt]]<BR>
SEMs of Pure ZEP dosage array: [[file:Pure ZEP SEMs.zip]]
+
SEMs of Pure ZEP dosage array: [[file:Pure ZEP SEMs.zip]]<BR>
SEMs of 2:1 ZEP dosage array: [[file:2_to_1 ZEP SEMs.zip]]
+
SEMs of 2:1 ZEP dosage array: [[file:2_to_1 ZEP SEMs.zip]]<BR>
  
 
login to BEAMER server:
 
login to BEAMER server:

Revision as of 15:34, 20 February 2013

Proximity Correction

Process overview: File:SWEEPER4-1 v4.ppt
SEMs of Pure ZEP dosage array: File:Pure ZEP SEMs.zip
SEMs of 2:1 ZEP dosage array: File:2 to 1 ZEP SEMs.zip

login to BEAMER server:

128.111.192.142

u:bowers

p:femto


Run a monte carlo simulation of the "substrate" and resist you are using in MC^3.

For example: ZEP(2k) on 500nm SOI with 1um BOx.

1) Use the drop down tab to select PENELOPE.

2) Build your layer stack in the PELELOPE GUI. z-Resolution must be an integer multiple of the thickness.

3) Check Save the result for the resist layer, for this example we have saved the "ZEP520_" layer


Return to  Cleanroom_Equipment