Measurements

Materials Characterization

Atomic Force Microscopy (AFM)

CNSI has a room devoted to AFM including 2 models Asylum and NanoScope. Contact Mark Cornish <cornish@engineering.ucsb.edu> to get tips and register. The cleanroom also has a NanoScope AFM.

Asylum AFM

Asylum_AFM_MFC-3D_Procedure_v1_-_Basic_Tapping_Mode.docx

Optical Characterization

LI curves

"Example:" This technique allows you to measure output power vs. injection current. The follwoing equipment is used:

• Keithley (link to equipment)
• Agilent powermeter (link)

The measurement can be controlled using this (link) software. A sample plot looks like this: (insert picture). More about this technique can be found in:

1. Mr.X et al., IEEE Journ. of Lightwave Technol., vol. x, pp. xxx-xxx, Aug. 2005
2. Our own uploaded description (in doc format maybe)

Electrical characterization

Analysis: http://gwyddion.net/download.php#stable-osx

Microwave measurements

Linearity measurements (OIP2, OIP3, SFDR,...)