Measurements
From OptoelectronicsWiki
Contents
Materials Characterization
Atomic Force Microscopy (AFM)
CNSI has a room devoted to AFM including 2 models Asylum and NanoScope. Contact Mark Cornish <cornish@engineering.ucsb.edu> to get tips and register. The cleanroom also has a NanoScope AFM.
Asylum AFM
NanoScope AFM
= Optical Characterization
LI curves
"Example:" This technique allows you to measure output power vs. injection current. The follwoing equipment is used:
- Keithley (link to equipment)
- Agilent powermeter (link)
The measurement can be controlled using this (link) software. A sample plot looks like this: (insert picture). More about this technique can be found in:
- Mr.X et al., IEEE Journ. of Lightwave Technol., vol. x, pp. xxx-xxx, Aug. 2005
- Our own uploaded description (in doc format maybe)
Electrical characterization
Analysis: http://gwyddion.net/download.php#stable-osx
Microwave measurements
Linearity measurements (OIP2, OIP3, SFDR,...)