Difference between revisions of "DesignRules"

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*8 um x 8 um, 50 um separation
 
*8 um x 8 um, 50 um separation
 
*No VC around verniers, so verviers have a chance of being exposed after substrate removal
 
*No VC around verniers, so verviers have a chance of being exposed after substrate removal
 +
*Detailed design rule, particularly for dense waveguide array (e.g., spiral, AWG), see [[File:DesignRule_VOC.pptx‎]].
 
* [[Using L-Edit's DRC to make sure no VCs on waveguides]]
 
* [[Using L-Edit's DRC to make sure no VCs on waveguides]]
 
Mesa
 
Mesa

Revision as of 13:39, 6 April 2012

Design Rules

WG

  • 3 um trenches for 200 um S-bends keep bending losses minimal
  • Put 50 um trench around Verniers and alignment markers

VC

Mesa

  • 14 um wide

QW

  • 16 um wide

Thick p metal

  • Same at N metal
  • 4 um wide
  • Keep 11 um separation between thick P and N metal.

N Metal

  • 20 um wide

Implant

  • 12 um wide
  • Implant after anneal to ensure the quality

Via

  • Min. 6 um opening
  • Open up area that is uniform at bottom

Plating

  • Use SPR series positive photoresist

Square/Circular TLM patterns design rules

  • Distance between adjacent pads - 4 to 30 microns in 5 or more steps.

Smaller the distance, more accurate the estimate.

  • Pad width/diameter must be atleast 2x the max distance between pads.

Eg. Say if you have 6 pads with 5,8,12,15,20 micron spacing, it is recommended that the pad be > (2x20) microns wide

  • Rectangular/square pads will need to be etched on the outer sides for isolation. That is not the case with circular pads.
  • With circular pads, it is difficult to lift-off small rings (<5 microns)

Keep radius between 30-60 microns.

  • Also, it is good to have a set of PTLMs that will be exposed to implantation step. This would be a way to check if the

implantation was effective. Resistance between pads with implantation must be hundred or kilo ohms or larger.

First draft of document explaining these: File:DesignRules.xlsx



Processing Rules

Always put a dummy/witness sample in the chamber when depositing metals and dielectrics.

  • Samples can later be used for determining thicknesses.
  • These samples can also be used if a given layer has to be etched on the real sample, but etch is not well characterized.