Difference between revisions of "Cleanroom Reports"

From OptoelectronicsWiki
Jump to: navigation, search
m
Line 38: Line 38:
 
|-
 
|-
 
| Cured SU8 (260 C for 30 min)|| Piranha (150mL H2SO4 + 50mL H2O2) ||  || ~500nm/s (v. fast) || MAY 27, 2010 || Geza ||   || Piranha does not attack SiN or Gold, suspect heavy undercut but have no data
 
| Cured SU8 (260 C for 30 min)|| Piranha (150mL H2SO4 + 50mL H2O2) ||  || ~500nm/s (v. fast) || MAY 27, 2010 || Geza ||   || Piranha does not attack SiN or Gold, suspect heavy undercut but have no data
|}
+
| Titanium || BHF ||  || ~3.33nm/s (order of magnitude estimate) || JULY 5, 2010 || Geza ||   || If you use PR as a mask AND if you etch for >5min, cure PR at 115C for 15min|}
  
  

Revision as of 09:52, 6 July 2010

  • List of etch and deposit rate for cleanroom tools. Each file includes the recipe being used and the calibrated etch rate.
  • Please update yours if you run any calibration so that everyone can keep track of them.
  • Wet etch recipes:
http://www.cleanroom.byu.edu/wet_etch.phtml
http://terpconnect.umd.edu/~browns/wetetch.html


Dry Etch
Etched material Equipment Substrate Recipe Latest etch rate Latest update date Latest update by Calib. file Note
Si ICP#2 SOI Bowers si etch # 127 drop from 4nm/s to 3nm/s APR 27, 2010 Jon Peters ICP#2 si etch rate  
Cured SU8 (260 C for 30 min) ICP#2 SOI Bowers SiOxVert etch # 101 ~111 nm/min MAY 27, 2010 Geza  
Cured SU8 (260 C for 30 min) ICP#2 SOI aSi SF6 based etch # 156 (200W) ~275 nm/min JUN 1, 2010 Geza  
Cured SU8 (260 C for 30 min) ICP#2 SOI aSi SF6 based etch # 156 (200W + 40 sccm O2) ~465 nm/min JUN 1, 2010 Geza  
Cured SU8 (260 C for 30 min) ICP#2 SOI aSi SF6 based etch # 156 (300W + 40 sccm O2) ~690 nm/min JUN 1, 2010 Geza Use cured (115C/15min) SPR220-7 as mask, mask etched at ~550nm/min. Carefully check mask for cracking.


Wet Etch
Etched material Solution Mask Latest etch rate Latest update date Latest update by Calib. file Note
Thermal oxide BHF PR or dielectric ~100nm/min        
PECVD oxide BHF PR or dielectric ~225nm/min        
PECVD SiN BHF   ~30-50nm/min   Jon P.    
PECVD SiN HF   ~500nm/min   Geza   PR does not survive as a mask
Cured SU8 (260 C for 30 min) Piranha (150mL H2SO4 + 50mL H2O2)   ~500nm/s (v. fast) MAY 27, 2010 Geza   Piranha does not attack SiN or Gold, suspect heavy undercut but have no data Titanium BHF   ~3.33nm/s (order of magnitude estimate) JULY 5, 2010 Geza   }


Dielectric Deposit
Material Equipment Latest deposit rate Latest update date Latest update by Calib. file Note
SiN PECVD          
SiO2 PECVD          
Ta2O5 Ebeam #2 1A/sec   Hui-Wen Script Deposit 180nm on blank Si sample, measure index and thickness, calculate required thickness from index (use Excel script), deposit dielectric on both facets (one at a time). Generally 180nm, n~2.15, purple color.