Collective Wisdom
From OptoelectronicsWiki
Rationale & Rules
This page lists a set of reviewed reports that can be used for background knowledge on modeling, fabrication and test & measurement. The aim of this page is to list reviewed, complete and well-written reports, with links and references to all the required background knowledge. To this end we have standardized the approach how we should write these documents:
- The template has a standardized cover page. Use this and fill it in completely. The MS Word template can be downloaded here.
- Write your report in the same style how you would write a journal or conference paper: introduction, theory, experimental setup, results, discussion, conclusion. Now you have version 0.
- Find at least two people who want to review your report. Ask them to be critical. Discuss with them and implement any changes. Now you have version 1.
- Version 1 can be uploaded to the list below. Version 0 not.
- The cover page allows you to track your changes over time. Increase the version number every time you want to make changes and re-upload.
List of reports
Title | Version | Author | Abstract | Link |
---|---|---|---|---|
On the Modeling of Semiconductor Optical Amplifiers | v1 | Martijn Heck | This report gives an overview of the model that can be used to simulate semiconductor optical amplifiers (SOAs) based on indium-phosphide, or III/V in general, gain material. Specific trade-offs and considerations for the application of an SOA in a coupled opto-electronic oscillator (COEO) or mode-locked laser (MLL) will be discussed. | Report |
On the Faby-Pérot fringes in transmission and insertion loss measurements | v1 | Martijn Heck | This report discusses and quantifies the detrimental effects of Fabry-Pérot resonances that appear when transmission measurements are done on chips that have uncoated facets. The hypothesis until now was that a spectral average over multiple fringes would be a valid approach. This report quantifies the effect. | Report |